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PHENOM
THROUGH
YOUR WORLD IN SECONDS
Bridging the gap between optical and electron microscopy. Phenom is a high-resolution desktop imaging tool with an optical camera for
never-lost navigation and a high quality electron microscope for
detailed imaging.
Its innovative user interface and intuitive touch screen control
produce superb quality images with minimal operator training. Key
specifications
»
Magnificstion range 20-20,000X (Digital Zoom 12X) »
maximum image resolution 2048x2048 pixels »
Sample loading time <30 seconds »
Total weight 55Kg »
Motorized
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PRODUCT FAMILIES |
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The Inspect™ Family offers two
scanning electron microscopes (SEM), one with field emission gun (FEG)
capabilities, to provide the ultimate in high-resolution imaging required
for today’s advanced research and industrial applications involving
material inspection and characterization. |
| The Quanta™ Family of tools,
with a variety of SEM/ESEM models and a DualBeam (FIB/SEM) system,
offers advanced, flexible solutions that make it easy to explore any
sample, whether non-conductive, moist, wet or dirty, in low-vacuum,
high-vacuum or ESEM modes. |
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The Nova™ Family provides three
scanning electron microscopes (SEM) with ESEM technology, and two
DualBeam™ (FIB/SEM) models, ideal for diverse characterization, analysis,
nanostructure prototyping and sample preparation tasks. |
| The Helios NanoLab™ , a DualBeam for
semiconductor and data storage labs, as well as industries and researchers
facing today’s most challenging applications, combines the most advanced
scanning electron microscope (SEM) and focused ion beam (FIB) technologies
with innovative gas chemistries, detectors and manipulators. |
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Strata™
Family:
Two DualBeam (FIB/SEM) systems that provide high-resolution characterization
and analysis, as well as S/TEM sample preparation and imaging. |
| The Expida™ Family offers two full
wafer DualBeam microscopes with 300mm capability for fast and accurate
3D defect characterization, failure analysis and transmission electron
microscope (TEM) sample preparation. |
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The FEI V600FIB™ is the most efficient,
flexible, and cost-effective circuit edit tool available for semiconductor
labs. It enables fast, versatile modification and analysis with a
single-column, focused ion beam (FIB) that effectively delivers high
throughput circuit modification, cross-sectioning, and failure analysis. |
| The Morgagni™ 268(D) is an adaptable,
easy-to-use transmission electron microscope (TEM) that delivers excellent
image quality. The Morgagni delivers great value to the demanding
scientific areas of cell biological research and diagnostic |
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Tecnai™
Family: Flexible TEM models designed specifically to provide ultra-high
resolution sample characterization, analysis, and 3D tomographic imaging. |
| The Titan™ 80-300 kV TEM is a high-end
imaging and analytical S/TEM instrument dedicated to corrector and
monochromator technologies. The Titan was designed for optimum stability,
enabling sub-Ångström imaging of nanostructures in both TEM and S/TEM
modes. |
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PRODUCT TYPES |
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Scanning
Electron Microscopes (SEM) are used for inspecting topographies
of materials with a magnification range that encompasses that of
optical microscopy and extends it to the nanoscale. They also provide
chemical composition analysis.
Transmission
Electron Microscopes (TEM) use high-voltage electron beams to
acquire ultra-high resolution sample images down to sub-Ångström
levels for analyzing the atomic structure, crystallographic structure
and composition of specimens.
DualBeam™
systems, scanning electron microscope and focused ion beam capabilities
combined, are the preferred solution for 3D microscopy and analysis
serving material characterization,
industrial failure analysis and process control applications. They
are designed to deliver integrated sample preparation and microanalysis
below 1 nm for high-throughput semiconductor
and data storage fabs and materials science and life science
labs.
Focused
Ion Beam (FIB) Tools: FIB systems utilize a finely focused beam
of gallium ions operated at low-beam currents for imaging and at
high-beam currents for site-specific milling. Their versatility
make them popular for a wide variety of applications, including
advanced circuit edit, and
revealing below-the-surface defects in advanced materials and devices.
FEI's
Specialty Tools are designed and engineered to meet your specific
need. From reliable preparation of cryogenic samples for pharmaceutical
research to preparing TEM samples from a 300 mm wafer in a semiconductor
lab, these tools will enable you to perform your work more quickly,
precisely, and easily. |
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