 |
|
| 
PHENOM THROUGH YOUR WORLD IN SECONDS
Bridging the gap between optical and electron microscopy. Phenom is a high-resolution desktop imaging tool with an optical camera for never-lost navigation and a high quality electron microscope for detailed imaging. Its innovative user interface and intuitive touch screen control produce superb quality images with minimal operator training. Key specifications » Magnificstion range 20-20,000X (Digital Zoom 12X) » maximum image resolution 2048x2048 pixels » Sample loading time <30 seconds » Total weight 55Kg » Motorized
| |  | Visit the FEI NanoCenter
The FEI NanoCenter is your complete source for news, information, and more from the world of nanotechnology, brought to you exclusively by FEI. | | | PRODUCT FAMILIES | | | |  | The Inspect™ Family offers two scanning electron microscopes (SEM), one with field emission gun (FEG) capabilities, to provide the ultimate in high-resolution imaging required for today’s advanced research and industrial applications involving material inspection and characterization. | | The Quanta™ Family of tools, with a variety of SEM/ESEM models and a DualBeam (FIB/SEM) system, offers advanced, flexible solutions that make it easy to explore any sample, whether non-conductive, moist, wet or dirty, in low-vacuum, high-vacuum or ESEM modes. |  | |  | The Nova™ Family provides three scanning electron microscopes (SEM) with ESEM technology, and two DualBeam™ (FIB/SEM) models, ideal for diverse characterization, analysis, nanostructure prototyping and sample preparation tasks. | | The Helios NanoLab™ , a DualBeam for semiconductor and data storage labs, as well as industries and researchers facing today’s most challenging applications, combines the most advanced scanning electron microscope (SEM) and focused ion beam (FIB) technologies with innovative gas chemistries, detectors and manipulators. |  | |  | Strata™ Family: Two DualBeam (FIB/SEM) systems that provide high-resolution characterization and analysis, as well as S/TEM sample preparation and imaging. | | The Expida™ Family offers two full wafer DualBeam microscopes with 300mm capability for fast and accurate 3D defect characterization, failure analysis and transmission electron microscope (TEM) sample preparation. |  | |  | The FEI V600FIB™ is the most efficient, flexible, and cost-effective circuit edit tool available for semiconductor labs. It enables fast, versatile modification and analysis with a single-column, focused ion beam (FIB) that effectively delivers high throughput circuit modification, cross-sectioning, and failure analysis. | | The Morgagni™ 268(D) is an adaptable, easy-to-use transmission electron microscope (TEM) that delivers excellent image quality. The Morgagni delivers great value to the demanding scientific areas of cell biological research and diagnostic |  | |  | Tecnai™ Family: Flexible TEM models designed specifically to provide ultra-high resolution sample characterization, analysis, and 3D tomographic imaging. | | The Titan™ 80-300 kV TEM is a high-end imaging and analytical S/TEM instrument dedicated to corrector and monochromator technologies. The Titan was designed for optimum stability, enabling sub-Ångström imaging of nanostructures in both TEM and S/TEM modes. |  | | | | | | | PRODUCT TYPES | | | | Scanning Electron Microscopes (SEM) are used for inspecting topographies of materials with a magnification range that encompasses that of optical microscopy and extends it to the nanoscale. They also provide chemical composition analysis. Transmission Electron Microscopes (TEM) use high-voltage electron beams to acquire ultra-high resolution sample images down to sub-Ångström levels for analyzing the atomic structure, crystallographic structure and composition of specimens. DualBeam™ systems, scanning electron microscope and focused ion beam capabilities combined, are the preferred solution for 3D microscopy and analysis serving material characterization, industrial failure analysis and process control applications. They are designed to deliver integrated sample preparation and microanalysis below 1 nm for high-throughput semiconductor and data storage fabs and materials science and life science labs. Focused Ion Beam (FIB) Tools: FIB systems utilize a finely focused beam of gallium ions operated at low-beam currents for imaging and at high-beam currents for site-specific milling. Their versatility make them popular for a wide variety of applications, including advanced circuit edit, and revealing below-the-surface defects in advanced materials and devices. FEI's Specialty Tools are designed and engineered to meet your specific need. From reliable preparation of cryogenic samples for pharmaceutical research to preparing TEM samples from a 300 mm wafer in a semiconductor lab, these tools will enable you to perform your work more quickly, precisely, and easily. |
|
