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Verios G4 XHR
The Thermo Scientificâ„¢ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
Supplier: Thermo Fisher
Category: Scanning Electron Microscope
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